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[Webinar] Practical Image Analysis using AI and Image-Pro Software

Practical Image Analysis using AI and Image-Pro [WEBINAR]

In this practical, application-focused webinar, we demonstrate how AI-based image analysis can be used to extract reliable, quantitative data from SEM images-start to finish-using Image-Pro software connected to Hitachi SEMs.

Building on a previous webinar that introduced the principles of machine learning and AI for image segmentation, this session shifts the focus to real-world use cases. We will walk through complete analysis workflows, starting with SEM image acquisition and ending with validated numerical results such as size distributions, area fractions, layer thickness, and defect statistics.

This webinar is aimed at users who want to move from “AI curiosity” to confident, everyday use of AI-driven image analysis in electron microscopy.

In this webinar, discover:

Who should attend?

Speakers​

Mats Erikkson Profile Photo

Mats Eriksson​

CEO, Spectral AB​

Mats Eriksson is the CEO of Spectral AB and has worked in electron microscopy for over 30 years. As a long-standing partner and distributor of Hitachi SEM solutions, he will guide participants through practical Image-Pro workflows.​

Tom Moyer Profile Photo new

Tom Moyer

Sales Manager, Media Cybernetics

Tom Moyer is a Sales Manager at Media Cybernetics with extensive experience in microscopy, digital imaging, and image analysis. He works closely with customers to help them extract meaningful, actionable data from images.

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