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Layers: Curved (EM)

The thickness of coatings, films, and layers plays a critical role in determining a material's mechanical, electrical, thermal, and optical properties. Accurate and reproducible layer thickness analysis is essential for manufacturing quality assurance, durability assessments, performance optimization, and regulatory compliance.

The Image-Pro Layer Thickness Protocol simplifies this analysis by breaking it into a series of structured steps, ensuring ease of use, accuracy, and high reproducibility. The protocol supports multiple methods of defining layer boundaries, including manual methods, threshold-based segmentation, machine learning, and deep learning models trained to identify layers in your specific material. Additionally, it streamlines the analysis of large data volumes, making it accessible even to users with little to no image analysis experience.

Techniques: SEM, TEM

Solution Requirements

Required Modules

Base

2D Automated Analysis

Materials EM Protocol Collection

Layers (EM) Protocol

Recommended Package

RELATED APPS

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Apps are designed for customers with a registered copy of Media Cybernetics software. Please review the App Center specifications tab to ensure your software is supported. To download the App, please fill out the form below.

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