Layers: Parallel (EM)
The thickness of coatings, films, and layers plays a critical role in determining a material's mechanical, electrical, thermal, and optical properties. Accurate and reproducible layer thickness analysis is essential for manufacturing quality assurance, durability assessments, performance optimization, and regulatory compliance.
The Image-Pro Layer Thickness Protocol simplifies this analysis by breaking it into a series of structured steps, ensuring ease of use, accuracy, and high reproducibility. The protocol supports multiple methods of defining layer boundaries, including manual methods, threshold-based segmentation, machine learning, and deep learning models trained to identify layers in your specific material. Additionally, it streamlines the analysis of large data volumes, making it accessible even to users with little to no image analysis experience.
Techniques: Brightfield
How it works
Select Image
Choose your image and specify the number and names of the layers to be analyzed.
Set Orientation & Direction
Set the orientation of your layers and specify the direction of analysis.
Define Layer Boundaries
Define layer boundaries manually, or use intensity-based segmentation, machine learning, or deep learning model.
Quantitative results
Automatically generate tables, heat maps, charts and even complex bespoke reports.
Measurement parameters supported
- • Mean thickness of each layer
- • Minimum thickness of each layer
- • Maximum thickness of each layer
- • Standard deviation of each layer
- • Custom user-defined measurements
Solution requirements
Required Modules
Base
2D Automated Analysis
Materials EM Protocol Collection
Layers (EM) Protocol
Recommended Package
